Stess Testing

Highly Accelerated Thermal Shock Testing. Developed by Integrated Reliability Test Systems in the USA to aid in stress screening of electronic circuits as one method of predicting circuit reliability.

In compliance with existing Thermal Shock tests, HATS offers a huge reduction in test times by a factor of 10 and enables 1000 cycles to be run in only 4 days thus saving time and money.

 

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